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Abstract:

In situ x-ray diffraction has been used to measure the shear strain (and thus strength) of single crystal copper shocked to 100 GPa pressures at strain rates over two orders of magnitude higher than those achieved previously. For shocks in the [001] direction there is a significant associated shear strain, while shocks in the [111] direction give negligible shear strain. We infer, using molecular dynamics simulations and VISAR (standing for 'velocity interferometer system for any reflector') measurements, that the strength of the material increases dramatically (to approximately 1 GPa) for these extreme strain rates.

Abstract:

The FLASH XUV-free electron laser has been used to irradiate solid samples at intensities of the order 1016 W cm-2 at a wavelength of 13.5 nm. The subsequent time integrated XUV emission was observed with a grating spectrometer. The electron temperature inferred from plasma line ratios was in the range 5-8 eV with electron density in the range 1021-1022 cm-3. These results are consistent with the saturation of absorption through bleaching of the L-edge by intense photo-absorption reported in an earlier publication. © 2009 Elsevier B.V. All rights reserved.